TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_37_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-017-017-02 | FUSED_ID : 6359364768398119186
  IC_TEMP :  -46.30 | VDDM : 1130.64 | AUX_INT :   -7.95 | CsaBias :   98.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30199e-03 / 2
  ADC_P0  : -7.95418e-03 ± 2.45417e-02
  ADC_P1  : 7.62379e-03 ± 5.68022e-04
  ADC_P2  : -3.67552e-06 ± 2.62007e-06
  CSA_Chi2/NDF : 7.30932e-05 / 2
  CSA_P0  : 5.74046e-02 ± 5.70244e-03
  CSA_P1  : 9.39272e-03 ± 4.29638e-04
  CSA_P2  : -3.65372e-05 ± 6.54287e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [25, 28, 56, 84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [16, 18, 68, 82, 87, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3119', '1.800', '0.1318', '1.800', '0.0857', '7.000', '0.7079', 1, 1, 1, 1, 1726094252.0619893]
VI_after__Init : ['1.202', '0.3119', '1.800', '0.1317', '1.800', '0.0799', '7.000', '0.7079', 1, 1, 1, 1, 1726094260.7672265]
VI_at__the_End : ['1.202', '0.5000', '1.800', '0.1339', '1.800', '0.1102', '7.000', '0.7089', 1, 1, 1, 1, 1726094325.1963592]