TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_32_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-017-020-02 | FUSED_ID : 6359364768398119234
  IC_TEMP :  -50.47 | VDDM : 1115.17 | AUX_INT :   -8.69 | CsaBias :   78.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35393e-03 / 2
  ADC_P0  : -8.68900e-03 ± 2.49681e-02
  ADC_P1  : 7.95279e-03 ± 5.88024e-04
  ADC_P2  : -4.79851e-06 ± 2.75448e-06
  CSA_Chi2/NDF : 1.58058e-04 / 2
  CSA_P0  : 5.70500e-02 ± 8.38552e-03
  CSA_P1  : 1.01465e-02 ± 6.31789e-04
  CSA_P2  : -4.74835e-05 ± 9.62140e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [16, 44, 47, 61, 89, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [103, 107, 108, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2593', '1.800', '0.1509', '1.800', '0.0837', '7.000', '0.7080', 1, 1, 1, 1, 1726093961.6373]
VI_after__Init : ['1.202', '0.2592', '1.800', '0.1509', '1.800', '0.0779', '7.000', '0.7080', 1, 1, 1, 1, 1726093969.6697035]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1370', '1.800', '0.1130', '7.000', '0.7087', 1, 1, 1, 1, 1726094029.5120366]