TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_29_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-017-022-02 | FUSED_ID : 6359364768398119266
  IC_TEMP :  -47.84 | VDDM : 1123.80 | AUX_INT :  -16.12 | CsaBias :   92.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59175e-03 / 2
  ADC_P0  : -1.61249e-02 ± 2.75701e-02
  ADC_P1  : 7.84398e-03 ± 6.36074e-04
  ADC_P2  : -4.74356e-06 ± 2.90443e-06
  CSA_Chi2/NDF : 5.21092e-05 / 2
  CSA_P0  : 5.69271e-02 ± 4.81481e-03
  CSA_P1  : 8.58395e-03 ± 3.62761e-04
  CSA_P2  : -2.60670e-05 ± 5.52443e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [15, 17, 52, 86, 101, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [37, 38, 63, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1258', '1.800', '0.1578', '1.800', '0.0821', '7.000', '0.7081', 1, 1, 1, 1, 1726093766.8002841]
VI_after__Init : ['1.202', '0.1258', '1.800', '0.1578', '1.800', '0.0763', '7.000', '0.7078', 1, 1, 1, 1, 1726093774.8796208]
VI_at__the_End : ['1.202', '0.4891', '1.800', '0.1354', '1.800', '0.1114', '7.000', '0.7088', 1, 1, 1, 1, 1726093845.9632802]