TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_58_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-018-011-11 | FUSED_ID : 6359364768398123195
  IC_TEMP :  -49.42 | VDDM : 1131.46 | AUX_INT :   -7.93 | CsaBias :   89.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02297e-03 / 2
  ADC_P0  : -7.92540e-03 ± 2.16549e-02
  ADC_P1  : 8.17132e-03 ± 5.21794e-04
  ADC_P2  : -5.29306e-06 ± 2.49648e-06
  CSA_Chi2/NDF : 1.14998e-04 / 2
  CSA_P0  : 5.74716e-02 ± 7.15265e-03
  CSA_P1  : 9.64448e-03 ± 5.38901e-04
  CSA_P2  : -3.91540e-05 ± 8.20682e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [35, 64, 79, 90, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [6, 8, 13, 37, 62, 74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1191', '1.800', '0.1774', '1.800', '0.0836', '7.000', '0.7071', 1, 1, 1, 1, 1726095511.741591]
VI_after__Init : ['1.202', '0.1190', '1.800', '0.1773', '1.800', '0.0779', '7.000', '0.7068', 1, 1, 1, 1, 1726095519.952019]
VI_at__the_End : ['1.201', '0.5058', '1.800', '0.1361', '1.800', '0.1111', '7.000', '0.7077', 1, 1, 1, 1, 1726095587.34099]