TEST_NAME : Wafer
TEST_DATE : 24_09_12-01_00_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-018-012-11 | FUSED_ID : 6359364768398123211
  IC_TEMP :  -51.25 | VDDM : 1131.63 | AUX_INT :   -7.01 | CsaBias :   73.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01308e-03 / 2
  ADC_P0  : -7.00798e-03 ± 2.15528e-02
  ADC_P1  : 8.14916e-03 ± 5.18766e-04
  ADC_P2  : -5.44985e-06 ± 2.46612e-06
  CSA_Chi2/NDF : 1.18478e-04 / 2
  CSA_P0  : 5.85275e-02 ± 7.26007e-03
  CSA_P1  : 9.88926e-03 ± 5.46994e-04
  CSA_P2  : -4.34172e-05 ± 8.33007e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [72, 103, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [12, 17, 37, 40, 73, 77, 78, 110, 122, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1153', '1.800', '0.1349', '1.800', '0.0855', '7.000', '0.7069', 1, 1, 1, 1, 1726095608.2846022]
VI_after__Init : ['1.202', '0.1153', '1.800', '0.1349', '1.800', '0.0800', '7.000', '0.7071', 1, 1, 1, 1, 1726095616.311863]
VI_at__the_End : ['1.201', '0.5071', '1.800', '0.1377', '1.801', '0.1125', '7.000', '0.7078', 1, 1, 1, 1, 1726095684.769879]