TEST_NAME : Wafer
TEST_DATE : 24_09_12-01_01_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-018-013-11 | FUSED_ID : 6359364768398123227
  IC_TEMP :  -53.39 | VDDM : 1128.54 | AUX_INT :   -8.89 | CsaBias :   88.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45870e-03 / 2
  ADC_P0  : -8.89317e-03 ± 2.58990e-02
  ADC_P1  : 8.14346e-03 ± 6.17028e-04
  ADC_P2  : -5.46288e-06 ± 2.91817e-06
  CSA_Chi2/NDF : 9.53621e-05 / 2
  CSA_P0  : 5.98690e-02 ± 6.51344e-03
  CSA_P1  : 9.41781e-03 ± 4.90740e-04
  CSA_P2  : -3.82334e-05 ± 7.47340e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 9, 19, 33, 48, 87, 95, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [4, 20, 32, 34, 46, 63, 65, 87, 92, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3025', '1.800', '0.1605', '1.800', '0.0946', '7.000', '0.7069', 1, 1, 1, 1, 1726095704.9133818]
VI_after__Init : ['1.202', '0.3025', '1.800', '0.1605', '1.800', '0.0889', '7.000', '0.7069', 1, 1, 1, 1, 1726095713.0678663]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1370', '1.800', '0.1110', '7.000', '0.7079', 1, 1, 1, 1, 1726095779.2339416]