TEST_NAME : Wafer
TEST_DATE : 24_09_12-01_11_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-018-019-12 | FUSED_ID : 6359364768398123324
  IC_TEMP :  -56.75 | VDDM : 1099.18 | AUX_INT :   -6.76 | CsaBias :   81.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32278e-03 / 2
  ADC_P0  : -6.76407e-03 ± 2.46988e-02
  ADC_P1  : 8.04778e-03 ± 5.94609e-04
  ADC_P2  : -4.79251e-06 ± 2.83766e-06
  CSA_Chi2/NDF : 1.24004e-04 / 2
  CSA_P0  : 5.88483e-02 ± 7.42746e-03
  CSA_P1  : 9.75109e-03 ± 5.59605e-04
  CSA_P2  : -4.40044e-05 ± 8.52213e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [0, 26, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [26, 33, 44, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1015', '1.800', '0.1237', '1.800', '0.0805', '7.000', '0.7075', 1, 1, 1, 1, 1726096286.4461138]
VI_after__Init : ['1.202', '0.1015', '1.800', '0.1237', '1.800', '0.0747', '7.000', '0.7072', 1, 1, 1, 1, 1726096294.5285835]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1361', '1.801', '0.1145', '7.000', '0.7082', 1, 1, 1, 1, 1726096362.942342]