TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_04_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-002-012-15 | FUSED_ID : 6359364768399106255
  IC_TEMP :  -62.50 | VDDM : 1118.09 | AUX_INT :   -8.62 | CsaBias :   68.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30706e-03 / 2
  ADC_P0  : -8.62421e-03 ± 2.44867e-02
  ADC_P1  : 8.60937e-03 ± 6.11636e-04
  ADC_P2  : -6.42622e-06 ± 3.02971e-06
  CSA_Chi2/NDF : 5.56046e-03 / 2
  CSA_P0  : 7.32515e-02 ± 4.97368e-02
  CSA_P1  : 7.31275e-03 ± 3.74731e-03
  CSA_P2  : -1.82821e-05 ± 5.70671e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [51, 54, 57, 64, 94, 95, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [10, 27, 51, 72, 95, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3737', '1.800', '0.1444', '1.800', '0.0936', '7.000', '0.7073', 1, 1, 1, 1, 1726121065.0287302]
VI_after__Init : ['1.202', '0.3737', '1.800', '0.1444', '1.800', '0.0877', '7.000', '0.7071', 1, 1, 1, 1, 1726121073.7949753]
VI_at__the_End : ['1.194', '0.4791', '1.800', '0.1407', '1.800', '0.1137', '7.000', '0.7079', 1, 1, 1, 1, 1726121141.0870118]