TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_09_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-002-015-15 | FUSED_ID : 6359364768399106303
  IC_TEMP :  -59.61 | VDDM : 1119.25 | AUX_INT :   -8.23 | CsaBias :   50.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10552e-03 / 2
  ADC_P0  : -8.22623e-03 ± 2.24951e-02
  ADC_P1  : 8.37606e-03 ± 5.48462e-04
  ADC_P2  : -6.02195e-06 ± 2.64988e-06
  CSA_Chi2/NDF : 2.02242e-04 / 2
  CSA_P0  : 5.79948e-02 ± 9.48545e-03
  CSA_P1  : 1.01464e-02 ± 7.14660e-04
  CSA_P2  : -5.21855e-05 ± 1.08834e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [2, 13, 15, 60, 108, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 6, 30, 43, 66, 81]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4047', '1.800', '0.1810', '1.799', '0.0978', '7.000', '0.7075', 1, 1, 1, 1, 1726121356.8784187]
VI_after__Init : ['1.201', '0.4051', '1.800', '0.1813', '1.800', '0.0925', '7.000', '0.7073', 1, 1, 1, 1, 1726121365.0476592]
VI_at__the_End : ['1.201', '0.4860', '1.800', '0.1359', '1.800', '0.1160', '7.000', '0.7081', 1, 1, 1, 1, 1726121428.0465481]