TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_10_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-002-016-08 | FUSED_ID : 6359364768399106312
  IC_TEMP :  -62.26 | VDDM : 1121.59 | AUX_INT :   -9.95 | CsaBias :   76.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64647e-03 / 2
  ADC_P0  : -9.94629e-03 ± 2.75126e-02
  ADC_P1  : 8.67762e-03 ± 6.91903e-04
  ADC_P2  : -6.35199e-06 ± 3.46332e-06
  CSA_Chi2/NDF : 1.44438e-04 / 2
  CSA_P0  : 5.77494e-02 ± 8.01610e-03
  CSA_P1  : 9.91424e-03 ± 6.03955e-04
  CSA_P2  : -4.79955e-05 ± 9.19753e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 24, 68, 86, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 34, 48, 55, 63, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1887', '1.800', '0.1345', '1.800', '0.0891', '7.000', '0.7072', 1, 1, 1, 1, 1726121454.3744845]
VI_after__Init : ['1.202', '0.1887', '1.800', '0.1345', '1.799', '0.0835', '7.000', '0.7072', 1, 1, 1, 1, 1726121462.620732]
VI_at__the_End : ['1.202', '0.4877', '1.800', '0.1382', '1.808', '0.1161', '7.000', '0.7082', 1, 1, 1, 1, 1726121531.1051385]