TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_12_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-002-017-08 | FUSED_ID : 6359364768399106328
  IC_TEMP :  -59.75 | VDDM : 1116.87 | AUX_INT :   -8.57 | CsaBias :   67.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14895e-03 / 2
  ADC_P0  : -8.56563e-03 ± 2.29225e-02
  ADC_P1  : 8.56247e-03 ± 5.67445e-04
  ADC_P2  : -6.47439e-06 ± 2.78441e-06
  CSA_Chi2/NDF : 1.58554e-04 / 2
  CSA_P0  : 5.94579e-02 ± 8.39867e-03
  CSA_P1  : 9.78065e-03 ± 6.32779e-04
  CSA_P2  : -4.54802e-05 ± 9.63648e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [11, 37, 43, 50, 52, 72, 120, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [3, 26, 41, 47]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3994', '1.800', '0.1231', '1.800', '0.1016', '7.000', '0.7072', 1, 1, 1, 1, 1726121550.8886101]
VI_after__Init : ['1.202', '0.3997', '1.800', '0.1231', '1.800', '0.0959', '7.000', '0.7074', 1, 1, 1, 1, 1726121559.2798142]
VI_at__the_End : ['1.202', '0.4929', '1.800', '0.1404', '1.802', '0.1137', '7.000', '0.7085', 1, 1, 1, 1, 1726121625.4246113]