TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_14_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-002-018-08 | FUSED_ID : 6359364768399106344
  IC_TEMP :  -62.15 | VDDM : 1122.87 | AUX_INT :   -8.44 | CsaBias :   59.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22510e-03 / 2
  ADC_P0  : -8.43999e-03 ± 2.36550e-02
  ADC_P1  : 8.60650e-03 ± 5.81882e-04
  ADC_P2  : -7.09602e-06 ± 2.82355e-06
  CSA_Chi2/NDF : 1.39913e-04 / 2
  CSA_P0  : 5.89262e-02 ± 7.88953e-03
  CSA_P1  : 9.80738e-03 ± 5.94419e-04
  CSA_P2  : -4.64458e-05 ± 9.05230e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 3, 34, 54, 58, 107, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [5, 32, 91, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2547', '1.800', '0.1283', '1.800', '0.0881', '7.000', '0.7076', 1, 1, 1, 1, 1726121647.5607674]
VI_after__Init : ['1.202', '0.2548', '1.800', '0.1283', '1.799', '0.0826', '7.000', '0.7075', 1, 1, 1, 1, 1726121656.2871242]
VI_at__the_End : ['1.202', '0.4903', '1.800', '0.1392', '1.800', '0.1149', '7.000', '0.7083', 1, 1, 1, 1, 1726121724.946762]