TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_46_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-008-10 | FUSED_ID : 6359364768399114378
  IC_TEMP :  -55.56 | VDDM : 1123.20 | AUX_INT :   -8.39 | CsaBias :   76.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26642e-03 / 2
  ADC_P0  : -8.38608e-03 ± 2.41293e-02
  ADC_P1  : 8.53867e-03 ± 6.08045e-04
  ADC_P2  : -5.71988e-06 ± 3.04371e-06
  CSA_Chi2/NDF : 1.60697e-04 / 2
  CSA_P0  : 6.08241e-02 ± 8.45524e-03
  CSA_P1  : 9.98172e-03 ± 6.37041e-04
  CSA_P2  : -4.70692e-05 ± 9.70139e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 24, 56, 77, 95, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [39, 52, 73, 89, 116, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1817', '1.800', '0.1519', '1.800', '0.0874', '7.000', '0.7078', 1, 1, 1, 1, 1726123588.9984696]
VI_after__Init : ['1.202', '0.1816', '1.800', '0.1519', '1.800', '0.0817', '7.000', '0.7078', 1, 1, 1, 1, 1726123597.8427196]
VI_at__the_End : ['1.202', '0.4984', '1.800', '0.1410', '1.800', '0.1150', '7.000', '0.7086', 1, 1, 1, 1, 1726123665.255819]