TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_48_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-009-10 | FUSED_ID : 6359364768399114394
  IC_TEMP :  -54.12 | VDDM : 1128.60 | AUX_INT :   -8.61 | CsaBias :   92.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.78401e-03 / 2
  ADC_P0  : -8.60676e-03 ± 2.87428e-02
  ADC_P1  : 7.84489e-03 ± 6.76277e-04
  ADC_P2  : -4.35643e-06 ± 3.15991e-06
  CSA_Chi2/NDF : 1.30500e-04 / 2
  CSA_P0  : 5.88267e-02 ± 7.61951e-03
  CSA_P1  : 9.66421e-03 ± 5.74075e-04
  CSA_P2  : -4.12873e-05 ± 8.74249e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 21, 87, 91, 98, 113, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [25, 66, 94, 97, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3371', '1.800', '0.1430', '1.800', '0.0901', '7.000', '0.7078', 1, 1, 1, 1, 1726123686.0561945]
VI_after__Init : ['1.202', '0.3372', '1.800', '0.1431', '1.800', '0.0844', '7.000', '0.7077', 1, 1, 1, 1, 1726123694.236539]
VI_at__the_End : ['1.202', '0.4999', '1.800', '0.1401', '1.800', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1726123760.6998656]