TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_49_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-010-10 | FUSED_ID : 6359364768399114410
  IC_TEMP :  -52.08 | VDDM : 1122.19 | AUX_INT :   -7.08 | CsaBias :   75.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85580e-04 / 2
  ADC_P0  : -7.07991e-03 ± 2.12720e-02
  ADC_P1  : 8.28134e-03 ± 5.24271e-04
  ADC_P2  : -5.31624e-06 ± 2.55660e-06
  CSA_Chi2/NDF : 1.23922e-04 / 2
  CSA_P0  : 5.94116e-02 ± 7.42500e-03
  CSA_P1  : 9.65851e-03 ± 5.59420e-04
  CSA_P2  : -4.18987e-05 ± 8.51931e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [5, 16, 20, 23, 42, 44, 45, 55, 61, 100, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [30, 63, 76, 83, 112, 113, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3667', '1.800', '0.1824', '1.800', '0.0994', '7.000', '0.7086', 1, 1, 1, 1, 1726123783.1550157]
VI_after__Init : ['1.201', '0.3666', '1.800', '0.1818', '1.800', '0.0919', '7.000', '0.7077', 1, 1, 1, 1, 1726123791.9222624]
VI_at__the_End : ['1.201', '0.4977', '1.800', '0.1389', '1.800', '0.1129', '7.000', '0.7084', 1, 1, 1, 1, 1726123851.257223]