TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_52_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-012-10 | FUSED_ID : 6359364768399114442
  IC_TEMP :  -55.84 | VDDM : 1129.05 | AUX_INT :   -6.87 | CsaBias :   67.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.38943e-04 / 2
  ADC_P0  : -6.86957e-03 ± 2.07626e-02
  ADC_P1  : 8.28732e-03 ± 5.11716e-04
  ADC_P2  : -5.35635e-06 ± 2.49538e-06
  CSA_Chi2/NDF : 1.53723e-04 / 2
  CSA_P0  : 5.99763e-02 ± 8.26974e-03
  CSA_P1  : 9.94194e-03 ± 6.23065e-04
  CSA_P2  : -4.54191e-05 ± 9.48854e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3967', '1.800', '0.1734', '1.800', '0.1005', '7.000', '0.7077', 1, 1, 1, 1, 1726123977.63491]
VI_after__Init : ['1.202', '0.3968', '1.800', '0.1734', '1.800', '0.0960', '7.000', '0.7080', 1, 1, 1, 1, 1726123985.7702367]
VI_at__the_End : ['1.201', '0.5017', '1.800', '0.1402', '1.800', '0.1139', '7.000', '0.7085', 1, 1, 1, 1, 1726124053.677578]