TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_54_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-013-10 | FUSED_ID : 6359364768399114458
  IC_TEMP :  -54.49 | VDDM : 1122.83 | AUX_INT :   -8.19 | CsaBias :   87.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20257e-03 / 2
  ADC_P0  : -8.19468e-03 ± 2.34984e-02
  ADC_P1  : 8.07475e-03 ± 5.57975e-04
  ADC_P2  : -5.28577e-06 ± 2.62704e-06
  CSA_Chi2/NDF : 9.93770e-05 / 2
  CSA_P0  : 5.77927e-02 ± 6.64914e-03
  CSA_P1  : 9.42237e-03 ± 5.00965e-04
  CSA_P2  : -3.99074e-05 ± 7.62910e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [19, 25, 73, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 12, 18, 24, 82, 103, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2044', '1.800', '0.1251', '1.800', '0.0885', '7.000', '0.7079', 1, 1, 1, 1, 1726124073.9960601]
VI_after__Init : ['1.202', '0.2044', '1.800', '0.1250', '1.800', '0.0833', '7.000', '0.7080', 1, 1, 1, 1, 1726124082.9203763]
VI_at__the_End : ['1.202', '0.4876', '1.800', '0.1373', '1.800', '0.1118', '7.000', '0.7084', 1, 1, 1, 1, 1726124151.9857237]