TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_56_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-014-10 | FUSED_ID : 6359364768399114474
  IC_TEMP :  -55.01 | VDDM : 1125.90 | AUX_INT :   -9.20 | CsaBias :   73.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35453e-03 / 2
  ADC_P0  : -9.19524e-03 ± 2.49105e-02
  ADC_P1  : 8.30670e-03 ± 5.97162e-04
  ADC_P2  : -6.07760e-06 ± 2.84128e-06
  CSA_Chi2/NDF : 1.33855e-04 / 2
  CSA_P0  : 5.88537e-02 ± 7.71684e-03
  CSA_P1  : 9.93206e-03 ± 5.81408e-04
  CSA_P2  : -4.73675e-05 ± 8.85416e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [23, 29, 57, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [1, 5, 10, 13, 32, 60, 66, 107, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3204', '1.800', '0.1524', '1.800', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1726124172.1669972]
VI_after__Init : ['1.202', '0.3205', '1.800', '0.1525', '1.800', '0.0809', '7.000', '0.7079', 1, 1, 1, 1, 1726124180.2344894]
VI_at__the_End : ['1.202', '0.4932', '1.800', '0.1374', '1.800', '0.1140', '7.000', '0.7085', 1, 1, 1, 1, 1726124247.4780762]