TEST_NAME : Wafer
TEST_DATE : 24_09_12-08_59_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-016-13 | FUSED_ID : 6359364768399114509
  IC_TEMP :  -54.88 | VDDM : 1133.55 | AUX_INT :   -8.50 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28857e-03 / 2
  ADC_P0  : -8.49501e-03 ± 2.43230e-02
  ADC_P1  : 8.40742e-03 ± 5.98281e-04
  ADC_P2  : -5.88121e-06 ± 2.91751e-06
  CSA_Chi2/NDF : 1.50149e-04 / 2
  CSA_P0  : 5.90958e-02 ± 8.17303e-03
  CSA_P1  : 9.90801e-03 ± 6.15779e-04
  CSA_P2  : -4.61344e-05 ± 9.37758e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [25, 55, 71]
 | N_BROKEN_SLOW :  [2]
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [6, 9, 42, 70, 79, 82, 94, 96, 104, 115, 127]
 | P_BROKEN_SLOW :  [2]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2463', '1.800', '0.1457', '1.800', '0.0850', '7.000', '0.7079', 1, 1, 1, 1, 1726124365.011743]
VI_after__Init : ['1.202', '0.2463', '1.800', '0.1457', '1.800', '0.0794', '7.000', '0.7076', 1, 1, 1, 1, 1726124373.7860038]
VI_at__the_End : ['1.202', '0.4988', '1.800', '0.1394', '1.800', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1726124441.261647]