TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_01_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-017-13 | FUSED_ID : 6359364768399114525
  IC_TEMP :  -51.26 | VDDM : 1122.55 | AUX_INT :   -9.85 | CsaBias :   81.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55248e-03 / 2
  ADC_P0  : -9.85340e-03 ± 2.66967e-02
  ADC_P1  : 8.37229e-03 ± 6.44159e-04
  ADC_P2  : -6.06779e-06 ± 3.09576e-06
  CSA_Chi2/NDF : 1.14455e-04 / 2
  CSA_P0  : 5.90652e-02 ± 7.13575e-03
  CSA_P1  : 9.65057e-03 ± 5.37627e-04
  CSA_P2  : -4.13435e-05 ± 8.18743e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [18, 64, 78, 93, 104, 109, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [7, 22, 36, 39, 53, 105, 116, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3162', '1.800', '0.1565', '1.800', '0.0859', '7.000', '0.7076', 1, 1, 1, 1, 1726124462.134944]
VI_after__Init : ['1.202', '0.3162', '1.800', '0.1565', '1.800', '0.0803', '7.000', '0.7077', 1, 1, 1, 1, 1726124470.1513913]
VI_at__the_End : ['1.202', '0.4991', '1.800', '0.1424', '1.800', '0.1118', '7.000', '0.7084', 1, 1, 1, 1, 1726124538.01701]