TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_02_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-018-13 | FUSED_ID : 6359364768399114541
  IC_TEMP :  -55.06 | VDDM : 1132.17 | AUX_INT :   -6.90 | CsaBias :   74.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.64831e-04 / 2
  ADC_P0  : -6.90112e-03 ± 2.10333e-02
  ADC_P1  : 8.15965e-03 ± 5.06261e-04
  ADC_P2  : -5.49943e-06 ± 2.40667e-06
  CSA_Chi2/NDF : 8.08816e-05 / 2
  CSA_P0  : 6.01427e-02 ± 5.99856e-03
  CSA_P1  : 9.18851e-03 ± 4.51948e-04
  CSA_P2  : -3.69504e-05 ± 6.88264e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [24, 33, 47, 48, 70, 84, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 27, 44, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2743', '1.800', '0.1024', '1.800', '0.0857', '7.000', '0.7084', 1, 1, 1, 1, 1726124558.983251]
VI_after__Init : ['1.202', '0.2742', '1.800', '0.1025', '1.800', '0.0786', '7.000', '0.7079', 1, 1, 1, 1, 1726124567.0846157]
VI_at__the_End : ['1.202', '0.4898', '1.800', '0.1366', '1.799', '0.1111', '7.000', '0.7084', 1, 1, 1, 1, 1726124634.0133765]