TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_09_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-004-022-13 | FUSED_ID : 6359364768399114605
  IC_TEMP :  -52.26 | VDDM : 1121.70 | AUX_INT :   -5.80 | CsaBias :   61.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.69326e-04 / 2
  ADC_P0  : -5.79756e-03 ± 2.11034e-02
  ADC_P1  : 8.41798e-03 ± 5.31090e-04
  ADC_P2  : -5.40357e-06 ± 2.64322e-06
  CSA_Chi2/NDF : 1.47921e-04 / 2
  CSA_P0  : 5.91391e-02 ± 8.11218e-03
  CSA_P1  : 1.00264e-02 ± 6.11195e-04
  CSA_P2  : -4.59151e-05 ± 9.30777e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [0, 3, 95, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [10, 17, 18, 48, 60, 104, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3151', '1.800', '0.1627', '1.800', '0.0881', '7.000', '0.7079', 1, 1, 1, 1, 1726124946.375942]
VI_after__Init : ['1.202', '0.3151', '1.800', '0.1627', '1.800', '0.0824', '7.000', '0.7077', 1, 1, 1, 1, 1726124954.6513138]
VI_at__the_End : ['1.202', '0.5042', '1.800', '0.1412', '1.800', '0.1117', '7.000', '0.7086', 1, 1, 1, 1, 1726125014.7035768]