TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_44_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-005-07 | FUSED_ID : 6359364768399118423
  IC_TEMP :  -54.20 | VDDM : 1131.12 | AUX_INT :   -7.78 | CsaBias :   86.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13414e-03 / 2
  ADC_P0  : -7.77738e-03 ± 2.28288e-02
  ADC_P1  : 7.89627e-03 ± 5.34216e-04
  ADC_P2  : -4.86367e-06 ± 2.47798e-06
  CSA_Chi2/NDF : 1.14738e-04 / 2
  CSA_P0  : 5.73398e-02 ± 7.14457e-03
  CSA_P1  : 9.28227e-03 ± 5.38292e-04
  CSA_P2  : -3.79294e-05 ± 8.19755e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [31, 40, 54, 99, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [21, 52, 88, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2799', '1.800', '0.1546', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1726127081.0807946]
VI_after__Init : ['1.201', '0.2800', '1.800', '0.1546', '1.800', '0.0827', '7.000', '0.7078', 1, 1, 1, 1, 1726127089.206235]
VI_at__the_End : ['1.201', '0.4878', '1.800', '0.1350', '1.800', '0.1115', '7.000', '0.7088', 1, 1, 1, 1, 1726127157.18102]