TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_39_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-008-07 | FUSED_ID : 6359364768399118471
  IC_TEMP :  -59.51 | VDDM : 1121.86 | AUX_INT :  -16.76 | CsaBias :   68.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37518e-03 / 2
  ADC_P0  : -1.67597e-02 ± 2.55900e-02
  ADC_P1  : 8.59008e-03 ± 6.35668e-04
  ADC_P2  : -6.05875e-06 ± 3.13665e-06
  CSA_Chi2/NDF : 1.57791e-04 / 2
  CSA_P0  : 5.75703e-02 ± 8.37845e-03
  CSA_P1  : 9.92220e-03 ± 6.31256e-04
  CSA_P2  : -4.85212e-05 ± 9.61328e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [5, 6, 13, 31, 40, 43, 67, 84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [16, 23, 33, 66, 75, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2779', '1.800', '0.1714', '1.800', '0.1001', '7.000', '0.7077', 1, 1, 1, 1, 1726126789.392148]
VI_after__Init : ['1.202', '0.2780', '1.800', '0.1714', '1.800', '0.0943', '7.000', '0.7079', 1, 1, 1, 1, 1726126798.3204985]
VI_at__the_End : ['1.202', '0.4857', '1.800', '0.1383', '1.799', '0.1160', '7.000', '0.7089', 1, 1, 1, 1, 1726126865.3952408]