TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_36_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-010-07 | FUSED_ID : 6359364768399118503
  IC_TEMP :  -49.83 | VDDM : 1130.06 | AUX_INT :   -8.31 | CsaBias :   81.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42942e-03 / 2
  ADC_P0  : -8.31334e-03 ± 2.56661e-02
  ADC_P1  : 8.24420e-03 ± 6.27273e-04
  ADC_P2  : -5.25372e-06 ± 3.03987e-06
  CSA_Chi2/NDF : 1.11397e-04 / 2
  CSA_P0  : 5.68135e-02 ± 7.03978e-03
  CSA_P1  : 9.41425e-03 ± 5.30396e-04
  CSA_P2  : -3.88764e-05 ± 8.07731e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [2, 33, 34, 37, 54, 65, 84, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [19, 24, 60, 66, 121, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3150', '1.800', '0.1677', '1.800', '0.0983', '7.000', '0.7078', 1, 1, 1, 1, 1726126595.1999605]
VI_after__Init : ['1.202', '0.3151', '1.800', '0.1678', '1.799', '0.0925', '7.000', '0.7079', 1, 1, 1, 1, 1726126603.3393414]
VI_at__the_End : ['1.202', '0.4922', '1.800', '0.1384', '1.800', '0.1123', '7.000', '0.7089', 1, 1, 1, 1, 1726126671.7730155]