TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_34_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-011-07 | FUSED_ID : 6359364768399118519
  IC_TEMP :  -56.05 | VDDM : 1115.56 | AUX_INT :   -9.79 | CsaBias :   79.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75507e-03 / 2
  ADC_P0  : -9.79470e-03 ± 2.84292e-02
  ADC_P1  : 8.22249e-03 ± 6.79596e-04
  ADC_P2  : -5.66825e-06 ± 3.22865e-06
  CSA_Chi2/NDF : 1.07733e-04 / 2
  CSA_P0  : 5.75907e-02 ± 6.92305e-03
  CSA_P1  : 9.27797e-03 ± 5.21602e-04
  CSA_P2  : -4.02556e-05 ± 7.94338e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [4, 33, 53, 84, 85, 99, 109, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 14, 21, 51, 60, 98, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2611', '1.800', '0.1221', '1.799', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1726126498.621186]
VI_after__Init : ['1.201', '0.2609', '1.800', '0.1220', '1.800', '0.0868', '7.000', '0.7079', 1, 1, 1, 1, 1726126507.38359]
VI_at__the_End : ['1.201', '0.4780', '1.800', '0.1365', '1.800', '0.1157', '7.000', '0.7085', 1, 1, 1, 1, 1726126567.3009772]