TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_33_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-012-07 | FUSED_ID : 6359364768399118535
  IC_TEMP :  -52.76 | VDDM : 1099.04 | AUX_INT :   -6.61 | CsaBias :   74.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.95725e-04 / 2
  ADC_P0  : -6.60972e-03 ± 1.90728e-02
  ADC_P1  : 8.12886e-03 ± 4.55154e-04
  ADC_P2  : -5.62421e-06 ± 2.14432e-06
  CSA_Chi2/NDF : 1.46944e-04 / 2
  CSA_P0  : 5.74325e-02 ± 8.08535e-03
  CSA_P1  : 9.57774e-03 ± 6.09173e-04
  CSA_P2  : -4.50448e-05 ± 9.27698e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [37, 94, 101, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [9, 15, 59, 91, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2456', '1.800', '0.1288', '1.799', '0.0885', '7.000', '0.7080', 1, 1, 1, 1, 1726126402.0026426]
VI_after__Init : ['1.202', '0.2456', '1.800', '0.1288', '1.800', '0.0833', '7.000', '0.7080', 1, 1, 1, 1, 1726126410.0819955]
VI_at__the_End : ['1.202', '0.4746', '1.800', '0.1366', '1.801', '0.1150', '7.000', '0.7086', 1, 1, 1, 1, 1726126469.23655]