TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_31_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-013-07 | FUSED_ID : 6359364768399118551
  IC_TEMP :  -61.01 | VDDM : 1112.22 | AUX_INT :   -6.81 | CsaBias :   66.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21910e-03 / 2
  ADC_P0  : -6.80790e-03 ± 2.36605e-02
  ADC_P1  : 8.21882e-03 ± 5.71419e-04
  ADC_P2  : -5.63680e-06 ± 2.72879e-06
  CSA_Chi2/NDF : 1.57216e-04 / 2
  CSA_P0  : 5.99291e-02 ± 8.36317e-03
  CSA_P1  : 9.41859e-03 ± 6.30105e-04
  CSA_P2  : -4.49492e-05 ± 9.59575e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [84, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [41, 43, 78, 91, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3112', '1.800', '0.1778', '1.800', '0.0959', '7.000', '0.7077', 1, 1, 1, 1, 1726126305.0869064]
VI_after__Init : ['1.202', '0.3114', '1.800', '0.1778', '1.800', '0.0900', '7.000', '0.7077', 1, 1, 1, 1, 1726126313.1853058]
VI_at__the_End : ['1.202', '0.4705', '1.800', '0.1380', '1.800', '0.1180', '7.000', '0.7085', 1, 1, 1, 1, 1726126374.2186923]