TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_23_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-018-00 | FUSED_ID : 6359364768399118624
  IC_TEMP :  -59.20 | VDDM : 1114.30 | AUX_INT :  -52.91 | CsaBias :   34.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29103e-03 / 2
  ADC_P0  : -5.29089e-02 ± 2.65297e-02
  ADC_P1  : 8.77174e-03 ± 6.17402e-04
  ADC_P2  : -7.74321e-06 ± 2.83646e-06
  CSA_Chi2/NDF : 1.83858e-04 / 2
  CSA_P0  : 5.77893e-02 ± 9.04407e-03
  CSA_P1  : 9.82320e-03 ± 6.81405e-04
  CSA_P2  : -4.85550e-05 ± 1.03770e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [27, 78, 100, 116, 119, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [39, 56, 72, 117, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1227', '1.800', '0.1474', '1.800', '0.0826', '7.000', '0.7079', 1, 1, 1, 1, 1726125819.0873063]
VI_after__Init : ['1.202', '0.1228', '1.800', '0.1474', '1.800', '0.0770', '7.000', '0.7077', 1, 1, 1, 1, 1726125827.0717678]
VI_at__the_End : ['1.202', '0.4791', '1.800', '0.1368', '1.800', '0.1170', '7.000', '0.7084', 1, 1, 1, 1, 1726125894.958768]