TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_22_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-019-00 | FUSED_ID : 6359364768399118640
  IC_TEMP :  -61.57 | VDDM : 1122.46 | AUX_INT :   -8.03 | CsaBias :   61.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.73138e-04 / 2
  ADC_P0  : -8.02638e-03 ± 2.10696e-02
  ADC_P1  : 8.70466e-03 ± 5.27832e-04
  ADC_P2  : -6.90008e-06 ± 2.61871e-06
  CSA_Chi2/NDF : 1.58488e-04 / 2
  CSA_P0  : 6.01165e-02 ± 8.39693e-03
  CSA_P1  : 9.90016e-03 ± 6.32648e-04
  CSA_P2  : -4.75715e-05 ± 9.63448e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [5, 17, 73, 77, 99, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [53, 64, 70, 88, 98, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2451', '1.800', '0.1279', '1.800', '0.0870', '7.000', '0.7080', 1, 1, 1, 1, 1726125721.943443]
VI_after__Init : ['1.202', '0.2451', '1.800', '0.1280', '1.800', '0.0817', '7.000', '0.7079', 1, 1, 1, 1, 1726125730.0559168]
VI_at__the_End : ['1.202', '0.4906', '1.800', '0.1429', '1.800', '0.1146', '7.000', '0.7090', 1, 1, 1, 1, 1726125789.161583]