TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_20_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-020-00 | FUSED_ID : 6359364768399118656
  IC_TEMP :  -59.49 | VDDM : 1123.60 | AUX_INT :   -7.36 | CsaBias :   68.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23799e-03 / 2
  ADC_P0  : -7.36445e-03 ± 2.38569e-02
  ADC_P1  : 8.53296e-03 ± 6.01181e-04
  ADC_P2  : -5.70974e-06 ± 3.00936e-06
  CSA_Chi2/NDF : 1.50150e-04 / 2
  CSA_P0  : 6.09195e-02 ± 8.17307e-03
  CSA_P1  : 1.01760e-02 ± 6.15782e-04
  CSA_P2  : -5.24276e-05 ± 9.37763e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [15, 26, 38, 53, 58, 121, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 14, 28, 29, 49, 62, 69]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1967', '1.800', '0.1347', '1.800', '0.0937', '7.000', '0.7079', 1, 1, 1, 1, 1726125625.6404352]
VI_after__Init : ['1.202', '0.1967', '1.800', '0.1348', '1.800', '0.0880', '7.000', '0.7079', 1, 1, 1, 1, 1726125633.7630084]
VI_at__the_End : ['1.202', '0.4896', '1.800', '0.1402', '1.799', '0.1134', '7.000', '0.7086', 1, 1, 1, 1, 1726125701.1909893]