TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_17_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-022-00 | FUSED_ID : 6359364768399118688
  IC_TEMP :  -65.44 | VDDM : 1119.95 | AUX_INT :   -8.39 | CsaBias :   75.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28354e-03 / 2
  ADC_P0  : -8.38733e-03 ± 2.42754e-02
  ADC_P1  : 8.40240e-03 ± 5.97111e-04
  ADC_P2  : -5.86791e-06 ± 2.91181e-06
  CSA_Chi2/NDF : 1.97512e-04 / 2
  CSA_P0  : 6.14617e-02 ± 9.37388e-03
  CSA_P1  : 9.96008e-03 ± 7.06255e-04
  CSA_P2  : -5.15506e-05 ± 1.07554e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [63, 116, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [21, 36, 38, 48, 86, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3795', '1.800', '0.1294', '1.800', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1726125431.172532]
VI_after__Init : ['1.202', '0.3801', '1.800', '0.1294', '1.800', '0.0869', '7.000', '0.7079', 1, 1, 1, 1, 1726125439.8838642]
VI_at__the_End : ['1.202', '0.4794', '1.800', '0.1422', '1.800', '0.1157', '7.000', '0.7088', 1, 1, 1, 1, 1726125503.415311]