TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_13_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-024-00 | FUSED_ID : 6359364768399118720
  IC_TEMP :  -59.37 | VDDM : 1110.82 | AUX_INT :   -8.42 | CsaBias :   66.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21250e-03 / 2
  ADC_P0  : -8.42024e-03 ± 2.36014e-02
  ADC_P1  : 8.39887e-03 ± 5.82423e-04
  ADC_P2  : -5.65150e-06 ± 2.85620e-06
  CSA_Chi2/NDF : 1.68575e-04 / 2
  CSA_P0  : 5.72608e-02 ± 8.66003e-03
  CSA_P1  : 9.98847e-03 ± 6.52471e-04
  CSA_P2  : -5.08105e-05 ± 9.93636e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 33, 39, 64, 67, 112, 114, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [17, 20, 35, 67, 80, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1417', '1.800', '0.1372', '1.800', '0.0835', '7.000', '0.7079', 1, 1, 1, 1, 1726125237.9351828]
VI_after__Init : ['1.202', '0.1415', '1.800', '0.1370', '1.799', '0.0782', '7.000', '0.7076', 1, 1, 1, 1, 1726125246.1844873]
VI_at__the_End : ['1.201', '0.4774', '1.800', '0.1388', '1.800', '0.1139', '7.000', '0.7085', 1, 1, 1, 1, 1726125312.24544]