TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_12_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-005-025-00 | FUSED_ID : 6359364768399118736
  IC_TEMP :  -60.20 | VDDM : 1124.06 | AUX_INT :   -8.46 | CsaBias :   76.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13122e-03 / 2
  ADC_P0  : -8.45689e-03 ± 2.27450e-02
  ADC_P1  : 8.58120e-03 ± 5.63052e-04
  ADC_P2  : -6.58012e-06 ± 2.76285e-06
  CSA_Chi2/NDF : 1.52255e-04 / 2
  CSA_P0  : 5.70078e-02 ± 8.23016e-03
  CSA_P1  : 9.77130e-03 ± 6.20083e-04
  CSA_P2  : -4.45618e-05 ± 9.44313e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [8, 19, 38, 42, 56, 57, 76, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [16, 77, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2505', '1.800', '0.1629', '1.800', '0.0935', '7.000', '0.7085', 1, 1, 1, 1, 1726125140.1707878]
VI_after__Init : ['1.202', '0.2502', '1.800', '0.1629', '1.800', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1726125148.2471645]
VI_at__the_End : ['1.202', '0.4906', '1.800', '0.1399', '1.800', '0.1119', '7.000', '0.7086', 1, 1, 1, 1, 1726125216.2418046]