TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_52_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-006-09 | FUSED_ID : 6359364768399122537
  IC_TEMP :  -57.14 | VDDM : 1127.62 | AUX_INT :   -8.83 | CsaBias :   76.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18634e-03 / 2
  ADC_P0  : -8.83027e-03 ± 2.33000e-02
  ADC_P1  : 8.56301e-03 ± 5.78657e-04
  ADC_P2  : -6.28052e-06 ± 2.85547e-06
  CSA_Chi2/NDF : 1.57078e-04 / 2
  CSA_P0  : 5.83263e-02 ± 8.35949e-03
  CSA_P1  : 1.01270e-02 ± 6.29827e-04
  CSA_P2  : -4.89383e-05 ± 9.59153e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 20, 26, 34, 55]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [8, 36, 43, 55, 68, 100, 107, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0934', '1.800', '0.1549', '1.800', '0.0843', '7.000', '0.7079', 1, 1, 1, 1, 1726127559.9611242]
VI_after__Init : ['1.202', '0.0934', '1.800', '0.1549', '1.800', '0.0786', '7.000', '0.7079', 1, 1, 1, 1, 1726127568.6845543]
VI_at__the_End : ['1.201', '0.4978', '1.800', '0.1409', '1.800', '0.1139', '7.000', '0.7087', 1, 1, 1, 1, 1726127631.745764]