TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_54_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-007-09 | FUSED_ID : 6359364768399122553
  IC_TEMP :  -56.31 | VDDM : 1118.00 | AUX_INT :   -7.94 | CsaBias :   69.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11436e-03 / 2
  ADC_P0  : -7.94332e-03 ± 2.26001e-02
  ADC_P1  : 8.68321e-03 ± 5.74547e-04
  ADC_P2  : -6.33141e-06 ± 2.89174e-06
  CSA_Chi2/NDF : 1.83278e-04 / 2
  CSA_P0  : 6.01150e-02 ± 9.02980e-03
  CSA_P1  : 1.07375e-02 ± 6.80330e-04
  CSA_P2  : -5.58115e-05 ± 1.03606e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [24, 48, 95, 114, 120, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [40, 58, 69, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1569', '1.800', '0.1278', '1.800', '0.0840', '7.000', '0.7089', 1, 1, 1, 1, 1726127656.7438867]
VI_after__Init : ['1.202', '0.1569', '1.800', '0.1278', '1.800', '0.0761', '7.000', '0.7079', 1, 1, 1, 1, 1726127664.8311646]
VI_at__the_End : ['1.202', '0.5078', '1.800', '0.1459', '1.800', '0.1129', '7.000', '0.7086', 1, 1, 1, 1, 1726127724.8166966]