TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_55_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-008-09 | FUSED_ID : 6359364768399122569
  IC_TEMP :  -56.27 | VDDM : 1127.51 | AUX_INT :   -5.86 | CsaBias :   82.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.75899e-04 / 2
  ADC_P0  : -5.85701e-03 ± 1.75596e-02
  ADC_P1  : 8.06222e-03 ± 4.16361e-04
  ADC_P2  : -5.62658e-06 ± 1.94237e-06
  CSA_Chi2/NDF : 1.27213e-04 / 2
  CSA_P0  : 5.67793e-02 ± 7.52294e-03
  CSA_P1  : 9.55343e-03 ± 5.66799e-04
  CSA_P2  : -4.12672e-05 ± 8.63168e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [31, 56, 68, 75, 88, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 8, 11, 44, 46, 87, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2966', '1.800', '0.1735', '1.800', '0.0926', '7.000', '0.7090', 1, 1, 1, 1, 1726127754.014471]
VI_after__Init : ['1.202', '0.2967', '1.800', '0.1734', '1.800', '0.0856', '7.000', '0.7079', 1, 1, 1, 1, 1726127762.7797477]
VI_at__the_End : ['1.201', '0.4897', '1.800', '0.1415', '1.799', '0.1125', '7.000', '0.7086', 1, 1, 1, 1, 1726127829.0697129]