TEST_NAME : Wafer
TEST_DATE : 24_09_12-09_59_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-010-09 | FUSED_ID : 6359364768399122601
  IC_TEMP :  -53.46 | VDDM : 1126.51 | AUX_INT :   -8.35 | CsaBias :   73.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34071e-03 / 2
  ADC_P0  : -8.34630e-03 ± 2.47867e-02
  ADC_P1  : 8.28642e-03 ± 5.93639e-04
  ADC_P2  : -6.22436e-06 ± 2.80674e-06
  CSA_Chi2/NDF : 9.21182e-05 / 2
  CSA_P0  : 6.02857e-02 ± 6.40170e-03
  CSA_P1  : 9.24018e-03 ± 4.82322e-04
  CSA_P2  : -3.72060e-05 ± 7.34519e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [9, 24, 78, 84, 107, 114, 116, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [16, 95, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3531', '1.800', '0.1483', '1.799', '0.0891', '7.000', '0.7077', 1, 1, 1, 1, 1726127948.897635]
VI_after__Init : ['1.202', '0.3532', '1.800', '0.1484', '1.800', '0.0835', '7.000', '0.7079', 1, 1, 1, 1, 1726127956.895987]
VI_at__the_End : ['1.202', '0.4915', '1.800', '0.1387', '1.800', '0.1132', '7.000', '0.7086', 1, 1, 1, 1, 1726128022.0189452]