TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_00_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-011-09 | FUSED_ID : 6359364768399122617
  IC_TEMP :  -54.02 | VDDM : 1127.84 | AUX_INT :   -6.93 | CsaBias :   91.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.52041e-04 / 2
  ADC_P0  : -6.92645e-03 ± 1.85054e-02
  ADC_P1  : 8.27836e-03 ± 4.44361e-04
  ADC_P2  : -6.17594e-06 ± 2.10617e-06
  CSA_Chi2/NDF : 1.08944e-04 / 2
  CSA_P0  : 5.83425e-02 ± 6.96183e-03
  CSA_P1  : 9.48757e-03 ± 5.24524e-04
  CSA_P2  : -3.98564e-05 ± 7.98787e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 26, 63, 66, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 3, 53, 89, 93, 106, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3580', '1.800', '0.1519', '1.800', '0.0888', '7.000', '0.7080', 1, 1, 1, 1, 1726128046.2181573]
VI_after__Init : ['1.202', '0.3582', '1.800', '0.1519', '1.800', '0.0835', '7.000', '0.7079', 1, 1, 1, 1, 1726128054.4185398]
VI_at__the_End : ['1.201', '0.4956', '1.800', '0.1394', '1.799', '0.1125', '7.000', '0.7088', 1, 1, 1, 1, 1726128121.2224429]