TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_02_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-012-09 | FUSED_ID : 6359364768399122633
  IC_TEMP :  -54.20 | VDDM : 1129.76 | AUX_INT :   -8.36 | CsaBias :   83.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32238e-03 / 2
  ADC_P0  : -8.35842e-03 ± 2.46325e-02
  ADC_P1  : 8.42144e-03 ± 6.03953e-04
  ADC_P2  : -6.14360e-06 ± 2.92877e-06
  CSA_Chi2/NDF : 1.35206e-04 / 2
  CSA_P0  : 6.06637e-02 ± 7.75570e-03
  CSA_P1  : 9.78582e-03 ± 5.84336e-04
  CSA_P2  : -4.34613e-05 ± 8.89874e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [31, 36, 55, 56, 75, 111, 120, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [23, 46, 57, 71, 86, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3112', '1.800', '0.1427', '1.800', '0.0934', '7.000', '0.7079', 1, 1, 1, 1, 1726128143.5157151]
VI_after__Init : ['1.202', '0.3113', '1.800', '0.1427', '1.800', '0.0879', '7.000', '0.7079', 1, 1, 1, 1, 1726128151.574126]
VI_at__the_End : ['1.202', '0.5017', '1.800', '0.1399', '1.800', '0.1137', '7.000', '0.7086', 1, 1, 1, 1, 1726128213.0113542]