TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_07_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-015-09 | FUSED_ID : 6359364768399122681
  IC_TEMP :  -55.40 | VDDM : 1125.15 | AUX_INT :   -8.73 | CsaBias :   85.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31409e-03 / 2
  ADC_P0  : -8.73385e-03 ± 2.45526e-02
  ADC_P1  : 8.61459e-03 ± 6.13279e-04
  ADC_P2  : -6.44062e-06 ± 3.03785e-06
  CSA_Chi2/NDF : 1.54371e-04 / 2
  CSA_P0  : 5.93657e-02 ± 8.28716e-03
  CSA_P1  : 1.01869e-02 ± 6.24378e-04
  CSA_P2  : -4.96557e-05 ± 9.50853e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [52, 54, 60, 62, 77, 84, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 39, 60, 70, 72, 80, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3215', '1.800', '0.1550', '1.800', '0.0898', '7.000', '0.7078', 1, 1, 1, 1, 1726128433.433537]
VI_after__Init : ['1.202', '0.3217', '1.800', '0.1542', '1.800', '0.0844', '7.000', '0.7078', 1, 1, 1, 1, 1726128442.254845]
VI_at__the_End : ['1.202', '0.4997', '1.800', '0.1401', '1.800', '0.1141', '7.000', '0.7086', 1, 1, 1, 1, 1726128506.9908566]