TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_10_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-017-14 | FUSED_ID : 6359364768399122718
  IC_TEMP :  -52.95 | VDDM : 1128.15 | AUX_INT :   -6.92 | CsaBias :   78.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.05943e-04 / 2
  ADC_P0  : -6.92497e-03 ± 2.03547e-02
  ADC_P1  : 8.61405e-03 ± 5.13930e-04
  ADC_P2  : -6.38258e-06 ± 2.55960e-06
  CSA_Chi2/NDF : 1.17859e-04 / 2
  CSA_P0  : 6.04865e-02 ± 7.24110e-03
  CSA_P1  : 9.70267e-03 ± 5.45564e-04
  CSA_P2  : -4.36193e-05 ± 8.30830e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [11, 13, 34, 64, 86, 102, 109, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [50, 58, 75, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4417', '1.800', '0.1258', '1.800', '0.0936', '7.000', '0.7077', 1, 1, 1, 1, 1726128628.1065469]
VI_after__Init : ['1.202', '0.4420', '1.800', '0.1258', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1726128636.2239544]
VI_at__the_End : ['1.202', '0.4973', '1.800', '0.1405', '1.800', '0.1120', '7.000', '0.7086', 1, 1, 1, 1, 1726128702.7639275]