TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_18_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-022-14 | FUSED_ID : 6359364768399122798
  IC_TEMP :  -49.83 | VDDM : 1130.42 | AUX_INT :   -8.44 | CsaBias :   96.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40421e-03 / 2
  ADC_P0  : -8.44341e-03 ± 2.54293e-02
  ADC_P1  : 8.10321e-03 ± 6.09007e-04
  ADC_P2  : -5.14626e-06 ± 2.89329e-06
  CSA_Chi2/NDF : 7.60219e-05 / 2
  CSA_P0  : 5.90149e-02 ± 5.81556e-03
  CSA_P1  : 9.20478e-03 ± 4.38161e-04
  CSA_P2  : -3.60168e-05 ± 6.67267e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 80, 93, 101, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [33, 37, 67, 70, 80, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3737', '1.800', '0.1349', '1.800', '0.0920', '7.000', '0.7087', 1, 1, 1, 1, 1726129112.275545]
VI_after__Init : ['1.202', '0.3739', '1.800', '0.1349', '1.800', '0.0847', '7.000', '0.7079', 1, 1, 1, 1, 1726129120.4279797]
VI_at__the_End : ['1.202', '0.4929', '1.800', '0.1359', '1.800', '0.1115', '7.000', '0.7087', 1, 1, 1, 1, 1726129188.397734]