TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_20_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-023-14 | FUSED_ID : 6359364768399122814
  IC_TEMP :  -55.44 | VDDM : 1127.57 | AUX_INT :   -8.48 | CsaBias :   75.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49304e-03 / 2
  ADC_P0  : -8.48003e-03 ± 2.62176e-02
  ADC_P1  : 8.44705e-03 ± 6.51355e-04
  ADC_P2  : -5.52033e-06 ± 3.22753e-06
  CSA_Chi2/NDF : 1.79337e-04 / 2
  CSA_P0  : 5.99173e-02 ± 8.93218e-03
  CSA_P1  : 1.04891e-02 ± 6.72975e-04
  CSA_P2  : -5.29923e-05 ± 1.02486e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [17, 22, 24, 51, 52, 84, 93, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 21, 60, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4655', '1.800', '0.1571', '1.800', '0.0958', '7.000', '0.7085', 1, 1, 1, 1, 1726129210.056036]
VI_after__Init : ['1.202', '0.4656', '1.800', '0.1572', '1.800', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1726129218.206444]
VI_at__the_End : ['1.202', '0.5070', '1.800', '0.1419', '1.800', '0.1126', '7.000', '0.7086', 1, 1, 1, 1, 1726129286.4542334]