TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_23_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-006-025-14 | FUSED_ID : 6359364768399122846
  IC_TEMP :  -51.06 | VDDM : 1123.53 | AUX_INT :   -7.15 | CsaBias :   75.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13863e-03 / 2
  ADC_P0  : -7.14701e-03 ± 2.28986e-02
  ADC_P1  : 8.31781e-03 ± 5.69360e-04
  ADC_P2  : -5.19967e-06 ± 2.80244e-06
  CSA_Chi2/NDF : 1.16080e-04 / 2
  CSA_P0  : 5.66884e-02 ± 7.18622e-03
  CSA_P1  : 9.47619e-03 ± 5.41430e-04
  CSA_P2  : -3.94355e-05 ± 8.24533e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 18, 66, 71, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [5, 19, 20, 42, 48, 73, 83, 90, 97, 101, 105, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2517', '1.800', '0.1617', '1.800', '0.0861', '7.000', '0.7079', 1, 1, 1, 1, 1726129402.9692802]
VI_after__Init : ['1.202', '0.2517', '1.800', '0.1616', '1.800', '0.0805', '7.000', '0.7078', 1, 1, 1, 1, 1726129411.850558]
VI_at__the_End : ['1.202', '0.4924', '1.800', '0.1364', '1.800', '0.1108', '7.000', '0.7086', 1, 1, 1, 1, 1726129472.6959596]