TEST_NAME : Wafer
TEST_DATE : 24_09_12-11_00_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-007-005-04 | FUSED_ID : 6359364768399126612
  IC_TEMP :  -52.82 | VDDM : 1125.04 | AUX_INT :   -7.73 | CsaBias :   69.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06402e-03 / 2
  ADC_P0  : -7.73076e-03 ± 2.20837e-02
  ADC_P1  : 8.68923e-03 ± 5.61420e-04
  ADC_P2  : -6.37339e-06 ± 2.82567e-06
  CSA_Chi2/NDF : 1.50640e-04 / 2
  CSA_P0  : 5.70199e-02 ± 8.18639e-03
  CSA_P1  : 9.97256e-03 ± 6.16785e-04
  CSA_P2  : -4.70854e-05 ± 9.39291e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [23, 59, 67, 70, 78, 83, 90, 92, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [17, 23, 29, 46, 51, 53, 70, 84, 95, 100, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2485', '1.800', '0.1613', '1.800', '0.0892', '7.000', '0.7080', 1, 1, 1, 1, 1726131634.1782255]
VI_after__Init : ['1.202', '0.2484', '1.800', '0.1599', '1.800', '0.0833', '7.000', '0.7078', 1, 1, 1, 1, 1726131642.2406132]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1422', '1.800', '0.1126', '7.000', '0.7088', 1, 1, 1, 1, 1726131710.4287558]