TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_58_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-007-006-04 | FUSED_ID : 6359364768399126628
  IC_TEMP :  -56.40 | VDDM : 1119.98 | AUX_INT :   -8.45 | CsaBias :   70.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41462e-03 / 2
  ADC_P0  : -8.44525e-03 ± 2.54717e-02
  ADC_P1  : 8.79468e-03 ± 6.48376e-04
  ADC_P2  : -6.65563e-06 ± 3.28208e-06
  CSA_Chi2/NDF : 1.68212e-04 / 2
  CSA_P0  : 5.89346e-02 ± 8.65069e-03
  CSA_P1  : 1.01995e-02 ± 6.51767e-04
  CSA_P2  : -5.06546e-05 ± 9.92564e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [32, 42, 46, 67, 78, 97, 101, 110, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3193', '1.800', '0.1512', '1.800', '0.0934', '7.000', '0.7089', 1, 1, 1, 1, 1726131537.9438272]
VI_after__Init : ['1.202', '0.3194', '1.800', '0.1512', '1.800', '0.0875', '7.000', '0.7080', 1, 1, 1, 1, 1726131545.9932206]
VI_at__the_End : ['1.202', '0.4959', '1.800', '0.1439', '1.800', '0.1147', '7.000', '0.7084', 1, 1, 1, 1, 1726131612.516689]