TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_52_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-007-010-04 | FUSED_ID : 6359364768399126692
  IC_TEMP :  -50.42 | VDDM : 1121.08 | AUX_INT :   -8.43 | CsaBias :   72.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49823e-03 / 2
  ADC_P0  : -8.43322e-03 ± 2.62285e-02
  ADC_P1  : 8.18287e-03 ± 6.21626e-04
  ADC_P2  : -5.77861e-06 ± 2.92661e-06
  CSA_Chi2/NDF : 8.18948e-05 / 2
  CSA_P0  : 5.78828e-02 ± 6.03602e-03
  CSA_P1  : 9.14580e-03 ± 4.54771e-04
  CSA_P2  : -3.68854e-05 ± 6.92562e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [29, 123, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [7, 30, 44, 46, 62, 63, 96, 113, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1734', '1.800', '0.1740', '1.800', '0.0903', '7.000', '0.7079', 1, 1, 1, 1, 1726131149.6925929]
VI_after__Init : ['1.201', '0.1735', '1.800', '0.1739', '1.800', '0.0851', '7.000', '0.7080', 1, 1, 1, 1, 1726131157.9087617]
VI_at__the_End : ['1.202', '0.4829', '1.800', '0.1342', '1.800', '0.1123', '7.000', '0.7089', 1, 1, 1, 1, 1726131223.7307901]