TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_50_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-007-011-04 | FUSED_ID : 6359364768399126708
  IC_TEMP :  -56.59 | VDDM : 1128.86 | AUX_INT :   -8.35 | CsaBias :   68.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29223e-03 / 2
  ADC_P0  : -8.34680e-03 ± 2.42910e-02
  ADC_P1  : 8.60732e-03 ± 5.98039e-04
  ADC_P2  : -6.83968e-06 ± 2.92061e-06
  CSA_Chi2/NDF : 1.52899e-04 / 2
  CSA_P0  : 5.91804e-02 ± 8.24754e-03
  CSA_P1  : 9.92976e-03 ± 6.21393e-04
  CSA_P2  : -4.70190e-05 ± 9.46307e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [6, 39, 42, 49, 66, 76, 93, 95, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [13, 27, 44, 54, 83, 88]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2691', '1.800', '0.1257', '1.800', '0.0901', '7.000', '0.7078', 1, 1, 1, 1, 1726131052.5359745]
VI_after__Init : ['1.202', '0.2693', '1.800', '0.1256', '1.800', '0.0846', '7.000', '0.7079', 1, 1, 1, 1, 1726131061.3393111]
VI_at__the_End : ['1.202', '0.4947', '1.800', '0.1423', '1.800', '0.1137', '7.000', '0.7086', 1, 1, 1, 1, 1726131119.7477248]