TEST_NAME : Wafer
TEST_DATE : 24_09_12-10_49_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-007-012-04 | FUSED_ID : 6359364768399126724
  IC_TEMP :  -53.55 | VDDM : 1130.27 | AUX_INT :   -5.49 | CsaBias :   69.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.34435e-04 / 2
  ADC_P0  : -5.48996e-03 ± 1.82868e-02
  ADC_P1  : 8.42730e-03 ± 4.46731e-04
  ADC_P2  : -6.56219e-06 ± 2.14796e-06
  CSA_Chi2/NDF : 1.12852e-04 / 2
  CSA_P0  : 5.99340e-02 ± 7.08560e-03
  CSA_P1  : 9.69829e-03 ± 5.33849e-04
  CSA_P2  : -4.21287e-05 ± 8.12988e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 15, 25, 62, 66, 69]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [10, 63, 67, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4777', '1.800', '0.1867', '1.800', '0.0987', '7.000', '0.7078', 1, 1, 1, 1, 1726130955.4973626]
VI_after__Init : ['1.202', '0.4785', '1.800', '0.1868', '1.800', '0.0933', '7.000', '0.7079', 1, 1, 1, 1, 1726130963.7388113]
VI_at__the_End : ['1.202', '0.4991', '1.800', '0.1407', '1.800', '0.1128', '7.000', '0.7085', 1, 1, 1, 1, 1726131024.001139]